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Other articles related with "Kelvin probe force microscopy"：
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117801 |
Yu Luo(罗宇), Weitao Su(苏伟涛), Juanjuan Zhang(张娟娟), Fei Chen(陈飞), Ke Wu(武可), Yijie Zeng(曾宜杰), and Hongwei Lu(卢红伟) |
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Unveiling localized electronic properties of ReS2 thin layers at nanoscale using Kelvin force probe microscopy combined with tip-enhanced Raman spectroscopy |
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Chin. Phys. B
2023 Vol.32 (11): 117801-117801
[Abstract]
(93)
[HTML 0 KB]
[PDF 780 KB]
(20)
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58801 |
Lu Liu(刘璐), Sheng-Li Zhang(张生利), Jian-Yu Wu(吴建宇), Wei-Huang Wang(王伟煌), Wei Liu(刘玮), Li Wu(武莉), Yi Zhang(张毅) |
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Current improvement in substrate structured Sb2S3 solar cells with MoSe2 interlayer |
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Chin. Phys. B
2020 Vol.29 (5): 58801-058801
[Abstract]
(524)
[HTML 1 KB]
[PDF 1523 KB]
(186)
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87701 |
Man-Hong Zhang(张满红) |
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Electron trapping properties at HfO2/SiO2 interface, studied by Kelvin probe force microscopy and theoretical analysis |
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Chin. Phys. B
2016 Vol.25 (8): 87701-087701
[Abstract]
(661)
[HTML 1 KB]
[PDF 293 KB]
(509)
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